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Products
Metrology Systems for PV Research and Industries
Thin Film Thickness Measurement (SE2000)
Ion Implant Monitoring (RT-1000)
Lifetime Measurement System WT-2000PVN
Lifetime Measurement System WT-1200A
Four Point Probe (FPP)
Emmitter Sheet Resistance (CMS)
Thickness Measurement (WTT)
Non Contact Resistivity Profiling
Contactless Resistivity Mapper
Non Contact CV Profiling
Minority Carrier Diffusion Length Measurement
Nanoindentation
Fourier Transformed Infrared Spectroscopy (FTIR)
Non Contact Mobility by Microwave Reflectance
Low Angle Light Scattering Tomography
Non-Contact Mobility and Sheet Resistance Metrology System
Mercury CV Profiling
Infrared Block Imaging
Photoluminescence Imaging
Ion Imlpant Dose Monitoring
P/N Type Determination
Geometry Inspection for Wafers
Saw Mark Inspection for Wafers
Sample Transfer Shuttle
Color Measurement for Cells
Lasers
CW Fiber Lasers & Amplifiers
ps/fs fiber lasers
Single Mode Diode Lasers
Single Frequency Lasers
Tunable Diode Lasers
Multi Laser Engines
Picosecond Pulsed Lasers
High Power and UV Lasers
Nitrogen Lasers
Frequency Comb
Laser Rack Systems
HeNe Lasers
Mask Aligner and Solar Simulator
Mask Aligner
Solar Simulator
UV Exposure Systems
Detection and Timing Electronics
TCSPC and Time tagging electronics
Single Photon Avalance Diodes
Hybrid Photomultiplier Detector Assembly
Analysis Software
Educational Laser kits
Fourier Transform Spectroscopy
Holography
Nd-Yag Laser
He-Ne Laser
Diode Laser
High Resolution 3D Printer
Ion Implanters
Medium Current R&D Implanter
Medium Current Production Implanter
Pulsion
Mask Aligner and Mask-less Laser Lithography
Epitaxial Wafers and HEMTs
GaN , SiC Based
GaAs & InP Based
Metrology Systems for Semiconductors
Spectroscopic Ellipsometer
Laser Ellipsometer
Deep Level Defect Inspection (DLTS)
Scanning Probe Microscopy + Atomic Force Microscope
Piezo Motion and Vibration Control
Piezo Actuators and stages
Positioning tools
Fiber Switches
Amplifiers
Microscopy
Single Photon Counting Microscopy
Single Molecule Senstivity Confocal Microscopy
Upright Time Resolved Microscopy
Fluorescence Lifetime Imaging Software
Light Source for Microscopy
MOCVD Reactors
Closed Couple Showerhead (CCS)
Planetary Reactor
Photoresist & Developer for micro-structuring
QCW diode bars & stacks
Conduction-cooled QCW stacked array
Dual QCW Linear stacked arrays
High Temperature/Multi-color QCW stack arrays
QCW linear bar arrays
QCW mini-stacked arrays
QCW stacked array (FAC)
Reference tools for measurment
Scientific Instruments
Vacuum Instruments
Time & Frequency
Analytical Instruments
Test & Measurment Instruments
Plasma Enhance Chemical Vapor Deposition
Reactive Ion Etching
Semi Conductor Crystals
Spectroscopy
Lifetime and Steady Steate Spectrometer
Modular Life Time spectrometer
Data Analysis Software
Spin Coaters
Surface Treatment Systems
UV Ozone Cleaning
Basic Plasma Cleaners
Expanded Plasma Cleaners
High Power Expanded Plasma Cleaners
TeraHertz Systems
Frequency Domain Setup
Time Domain Setup
THz power and Energy Detectors
TeraSpike Microprobe Series
UV Exposure Systems
Wafer Handling Tools
Interferometer
Broadband Spectroscopy
2D Electronic Spectroscopy
Hyperspectral Camera
NIR 400-1000 nm
SWIR 900-1700 nm
Extended SWIR 900-2300 nm
Applications
LED Chip Manufacturing
Life Sciences
Lithography
Material Science
MEMS Technology
Metrology
Microfluidics
Nanotechnology
Photonics
PV Solar Energy
Quantum Technology
Remote Sensing
Scientific Educational Kits
Spectroscopy
Terahertz Sensing
Thin Film
UV Exposure
Learning Center
Events
Upcoming
Past Events
Partners
Principal
Customer
About Us
Company
Career
Contact Us
Home
Products
Metrology Systems for PV Research and Industries
Thin Film Thickness Measurement (SE2000)
Ion Implant Monitoring (RT-1000)
Lifetime Measurement System WT-2000PVN
Lifetime Measurement System WT-1200A
Four Point Probe (FPP)
Emmitter Sheet Resistance (CMS)
Thickness Measurement (WTT)
Non Contact Resistivity Profiling
Contactless Resistivity Mapper
Non Contact CV Profiling
Minority Carrier Diffusion Length Measurement
Nanoindentation
Fourier Transformed Infrared Spectroscopy (FTIR)
Non Contact Mobility by Microwave Reflectance
Low Angle Light Scattering Tomography
Non-Contact Mobility and Sheet Resistance Metrology System
Mercury CV Profiling
Infrared Block Imaging
Photoluminescence Imaging
Ion Imlpant Dose Monitoring
P/N Type Determination
Geometry Inspection for Wafers
Saw Mark Inspection for Wafers
Sample Transfer Shuttle
Color Measurement for Cells
Lasers
CW Fiber Lasers & Amplifiers
ps/fs fiber lasers
Single Mode Diode Lasers
Single Frequency Lasers
Tunable Diode Lasers
Multi Laser Engines
Picosecond Pulsed Lasers
High Power and UV Lasers
Nitrogen Lasers
Frequency Comb
Laser Rack Systems
HeNe Lasers
Mask Aligner and Solar Simulator
Mask Aligner
Solar Simulator
UV Exposure Systems
Detection and Timing Electronics
TCSPC and Time tagging electronics
Single Photon Avalance Diodes
Hybrid Photomultiplier Detector Assembly
Analysis Software
Educational Laser kits
Fourier Transform Spectroscopy
Holography
Nd-Yag Laser
He-Ne Laser
Diode Laser
High Resolution 3D Printer
Ion Implanters
Medium Current R&D Implanter
Medium Current Production Implanter
Pulsion
Mask Aligner and Mask-less Laser Lithography
Epitaxial Wafers and HEMTs
GaN , SiC Based
GaAs & InP Based
Metrology Systems for Semiconductors
Spectroscopic Ellipsometer
Laser Ellipsometer
Deep Level Defect Inspection (DLTS)
Scanning Probe Microscopy + Atomic Force Microscope
Piezo Motion and Vibration Control
Piezo Actuators and stages
Positioning tools
Fiber Switches
Amplifiers
Microscopy
Single Photon Counting Microscopy
Single Molecule Senstivity Confocal Microscopy
Upright Time Resolved Microscopy
Fluorescence Lifetime Imaging Software
Light Source for Microscopy
MOCVD Reactors
Closed Couple Showerhead (CCS)
Planetary Reactor
Photoresist & Developer for micro-structuring
QCW diode bars & stacks
Conduction-cooled QCW stacked array
Dual QCW Linear stacked arrays
High Temperature/Multi-color QCW stack arrays
QCW linear bar arrays
QCW mini-stacked arrays
QCW stacked array (FAC)
Reference tools for measurment
Scientific Instruments
Vacuum Instruments
Time & Frequency
Analytical Instruments
Test & Measurment Instruments
Plasma Enhance Chemical Vapor Deposition
Reactive Ion Etching
Semi Conductor Crystals
Spectroscopy
Lifetime and Steady Steate Spectrometer
Modular Life Time spectrometer
Data Analysis Software
Spin Coaters
Surface Treatment Systems
UV Ozone Cleaning
Basic Plasma Cleaners
Expanded Plasma Cleaners
High Power Expanded Plasma Cleaners
TeraHertz Systems
Frequency Domain Setup
Time Domain Setup
THz power and Energy Detectors
TeraSpike Microprobe Series
UV Exposure Systems
Wafer Handling Tools
Interferometer
Broadband Spectroscopy
2D Electronic Spectroscopy
Hyperspectral Camera
NIR 400-1000 nm
SWIR 900-1700 nm
Extended SWIR 900-2300 nm
Applications
LED Chip Manufacturing
Life Sciences
Lithography
Material Science
MEMS Technology
Metrology
Microfluidics
Nanotechnology
Photonics
PV Solar Energy
Quantum Technology
Remote Sensing
Scientific Educational Kits
Spectroscopy
Terahertz Sensing
Thin Film
UV Exposure
Learning Center
Events
Upcoming
Past Events
Partners
Principal
Customer
About Us
Company
Career
Contact Us
PV Solar Energy
Ultralong Charge Carrier Recombination Time in Methylammonium Lead Halide Perovskites
Surface Voltage and μPCD Mapping of Defect in Epitaxial SiC
Home
Products
Metrology Systems for PV Research and Industries
Thin Film Thickness Measurement (SE2000)
Ion Implant Monitoring (RT-1000)
Lifetime Measurement System WT-2000PVN
Lifetime Measurement System WT-1200A
Four Point Probe (FPP)
Emmitter Sheet Resistance (CMS)
Thickness Measurement (WTT)
Non Contact Resistivity Profiling
Contactless Resistivity Mapper
Non Contact CV Profiling
Minority Carrier Diffusion Length Measurement
Nanoindentation
Fourier Transformed Infrared Spectroscopy (FTIR)
Non Contact Mobility by Microwave Reflectance
Low Angle Light Scattering Tomography
Non-Contact Mobility and Sheet Resistance Metrology System
Mercury CV Profiling
Infrared Block Imaging
Photoluminescence Imaging
Ion Imlpant Dose Monitoring
P/N Type Determination
Geometry Inspection for Wafers
Saw Mark Inspection for Wafers
Sample Transfer Shuttle
Color Measurement for Cells
Lasers
CW Fiber Lasers & Amplifiers
ps/fs fiber lasers
Single Mode Diode Lasers
Single Frequency Lasers
Tunable Diode Lasers
Multi Laser Engines
Picosecond Pulsed Lasers
High Power and UV Lasers
Nitrogen Lasers
Frequency Comb
Laser Rack Systems
HeNe Lasers
Mask Aligner and Solar Simulator
Mask Aligner
Solar Simulator
UV Exposure Systems
Detection and Timing Electronics
TCSPC and Time tagging electronics
Single Photon Avalance Diodes
Hybrid Photomultiplier Detector Assembly
Analysis Software
Educational Laser kits
Fourier Transform Spectroscopy
Holography
Nd-Yag Laser
He-Ne Laser
Diode Laser
High Resolution 3D Printer
Ion Implanters
Medium Current R&D Implanter
Medium Current Production Implanter
Pulsion
Mask Aligner and Mask-less Laser Lithography
Epitaxial Wafers and HEMTs
GaN , SiC Based
GaAs & InP Based
Metrology Systems for Semiconductors
Spectroscopic Ellipsometer
Laser Ellipsometer
Deep Level Defect Inspection (DLTS)
Scanning Probe Microscopy + Atomic Force Microscope
Piezo Motion and Vibration Control
Piezo Actuators and stages
Positioning tools
Fiber Switches
Amplifiers
Microscopy
Single Photon Counting Microscopy
Single Molecule Senstivity Confocal Microscopy
Upright Time Resolved Microscopy
Fluorescence Lifetime Imaging Software
Light Source for Microscopy
MOCVD Reactors
Closed Couple Showerhead (CCS)
Planetary Reactor
Photoresist & Developer for micro-structuring
QCW diode bars & stacks
Conduction-cooled QCW stacked array
Dual QCW Linear stacked arrays
High Temperature/Multi-color QCW stack arrays
QCW linear bar arrays
QCW mini-stacked arrays
QCW stacked array (FAC)
Reference tools for measurment
Scientific Instruments
Vacuum Instruments
Time & Frequency
Analytical Instruments
Test & Measurment Instruments
Plasma Enhance Chemical Vapor Deposition
Reactive Ion Etching
Semi Conductor Crystals
Spectroscopy
Lifetime and Steady Steate Spectrometer
Modular Life Time spectrometer
Data Analysis Software
Spin Coaters
Surface Treatment Systems
UV Ozone Cleaning
Basic Plasma Cleaners
Expanded Plasma Cleaners
High Power Expanded Plasma Cleaners
TeraHertz Systems
Frequency Domain Setup
Time Domain Setup
THz power and Energy Detectors
TeraSpike Microprobe Series
UV Exposure Systems
Wafer Handling Tools
Interferometer
Broadband Spectroscopy
2D Electronic Spectroscopy
Hyperspectral Camera
NIR 400-1000 nm
SWIR 900-1700 nm
Extended SWIR 900-2300 nm
Applications
LED Chip Manufacturing
Life Sciences
Lithography
Material Science
MEMS Technology
Metrology
Microfluidics
Nanotechnology
Photonics
PV Solar Energy
Quantum Technology
Remote Sensing
Scientific Educational Kits
Spectroscopy
Terahertz Sensing
Thin Film
UV Exposure
Learning Center
Events
Upcoming
Past Events
Partners
Principal
Customer
About Us
Company
Career
Contact Us
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