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    • Metrology Systems for PV Research and Industries

      • Thin Film Thickness Measurement (SE2000)
      • Ion Implant Monitoring (RT-1000)
      • Lifetime Measurement System WT-2000PVN
      • Lifetime Measurement System WT-1200A
      • Four Point Probe (FPP)
      • Emmitter Sheet Resistance (CMS)
      • Thickness Measurement (WTT)
      • Non Contact Resistivity Profiling
      • Contactless Resistivity Mapper
      • Non Contact CV Profiling
      • Minority Carrier Diffusion Length Measurement
      • Nanoindentation
      • Fourier Transformed Infrared Spectroscopy (FTIR)
      • Non Contact Mobility by Microwave Reflectance
      • Low Angle Light Scattering Tomography
      • Non-Contact Mobility and Sheet Resistance Metrology System
      • Mercury CV Profiling
      • Infrared Block Imaging
      • Photoluminescence Imaging
      • Ion Imlpant Dose Monitoring
      • P/N Type Determination
      • Geometry Inspection for Wafers
      • Saw Mark Inspection for Wafers
      • Sample Transfer Shuttle
      • Color Measurement for Cells

      Lasers

      • CW Fiber Lasers & Amplifiers
      • ps/fs fiber lasers
      • Single Mode Diode Lasers
      • Single Frequency Lasers
      • Tunable Diode Lasers
      • Multi Laser Engines
      • Picosecond Pulsed Lasers
      • High Power and UV Lasers
      • Nitrogen Lasers
      • Frequency Comb
      • Laser Rack Systems
      • Pulsed Laser Diodes
      • CW Laser Diodes
      • HeNe Lasers

      Mask Aligner and Solar Simulator

      • Mask Aligner
      • Solar Simulator
      • UV Exposure Systems

      Detection and Timing Electronics

      • TCSPC and Time tagging electronics
      • Single Photon Avalance Diodes
      • Hybrid Photomultiplier Detector Assembly
      • Analysis Software
      • Single Photon Counting Modules
      • Avalanche Photodiodes
      • IR Detectors

      Educational Laser kits

      • Fourier Transform Spectroscopy
      • Holography
      • Nd-Yag Laser
      • He-Ne Laser
      • Diode Laser

      High Resolution 3D Printer

      Ion Implanters

      • Medium Current R&D Implanter
      • Medium Current Production Implanter
      • Pulsion

      Mask Aligner and Mask-less Laser Lithography

      Epitaxial Wafers and HEMTs

      • GaN , SiC Based
      • GaAs & InP Based

      Metrology Systems for Semiconductors

      • Spectroscopic Ellipsometer
      • Laser Ellipsometer
      • Deep Level Defect Inspection (DLTS)
      • Scanning Probe Microscopy + Atomic Force Microscope

      Piezo Motion and Vibration Control

      • Piezo Actuators and stages
      • Positioning tools
      • Fiber Switches
      • Amplifiers

      Microscopy

      • Single Photon Counting Microscopy
      • Single Molecule Senstivity Confocal Microscopy
      • Upright Time Resolved Microscopy
      • Fluorescence Lifetime Imaging Software
      • Light Source for Microscopy

      MOCVD Reactors

      • Closed Couple Showerhead (CCS)
      • Planetary Reactor

      Molecular-Beam Epitaxy

      Low Temperature STM/AFM

      Photoresist & Developer for micro-structuring

      QCW diode bars & stacks

      • Conduction-cooled QCW stacked array
      • Dual QCW Linear stacked arrays
      • High Temperature/Multi-color QCW stack arrays
      • QCW linear bar arrays
      • QCW mini-stacked arrays
      • QCW stacked array (FAC)

      Reference tools for measurment

      • Scientific Instruments
      • Vacuum Instruments
      • Time & Frequency
      • Analytical Instruments
      • Test & Measurment Instruments

      Plasma Enhance Chemical Vapor Deposition

      Reactive Ion Etching

      Semi Conductor Crystals

      Spectroscopy

      • Lifetime and Steady Steate Spectrometer
      • Modular Life Time spectrometer
      • Data Analysis Software

      Spin Coaters

      Surface Treatment Systems

      • UV Ozone Cleaning
      • Basic Plasma Cleaners
      • Expanded Plasma Cleaners
      • High Power Expanded Plasma Cleaners
      • Rapid Temperature Annealing Systems

      TeraHertz Systems

      • Frequency Domain Setup
      • Time Domain Setup
      • THz power and Energy Detectors
      • TeraSpike Microprobe Series

      UV Exposure Systems

      Wafer Handling Tools

      Interferometer

      • Broadband Spectroscopy
      • 2D Electronic Spectroscopy

      Hyperspectral Camera

      • NIR 400-1000 nm
      • SWIR 900-1700 nm
      • Extended SWIR 900-2300 nm
  • Applications
      • LED Chip Manufacturing
      • Life Sciences
      • Lithography
      • Material Science
      • MEMS Technology
      • Metrology
      • Microfluidics
      • Nanotechnology
      • Photonics
      • PV Solar Energy
      • Quantum Technology
      • Scientific Educational Kits
      • Spectroscopy
      • Terahertz Sensing
      • Thin Film
      • UV Exposure
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    • Past Events
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  • Company
  • Contact Us
Simco Global
  • Home
  • Products
    • Metrology Systems for PV Research and Industries

      • Thin Film Thickness Measurement (SE2000)
      • Ion Implant Monitoring (RT-1000)
      • Lifetime Measurement System WT-2000PVN
      • Lifetime Measurement System WT-1200A
      • Four Point Probe (FPP)
      • Emmitter Sheet Resistance (CMS)
      • Thickness Measurement (WTT)
      • Non Contact Resistivity Profiling
      • Contactless Resistivity Mapper
      • Non Contact CV Profiling
      • Minority Carrier Diffusion Length Measurement
      • Nanoindentation
      • Fourier Transformed Infrared Spectroscopy (FTIR)
      • Non Contact Mobility by Microwave Reflectance
      • Low Angle Light Scattering Tomography
      • Non-Contact Mobility and Sheet Resistance Metrology System
      • Mercury CV Profiling
      • Infrared Block Imaging
      • Photoluminescence Imaging
      • Ion Imlpant Dose Monitoring
      • P/N Type Determination
      • Geometry Inspection for Wafers
      • Saw Mark Inspection for Wafers
      • Sample Transfer Shuttle
      • Color Measurement for Cells

      Lasers

      • CW Fiber Lasers & Amplifiers
      • ps/fs fiber lasers
      • Single Mode Diode Lasers
      • Single Frequency Lasers
      • Tunable Diode Lasers
      • Multi Laser Engines
      • Picosecond Pulsed Lasers
      • High Power and UV Lasers
      • Nitrogen Lasers
      • Frequency Comb
      • Laser Rack Systems
      • Pulsed Laser Diodes
      • CW Laser Diodes
      • HeNe Lasers

      Mask Aligner and Solar Simulator

      • Mask Aligner
      • Solar Simulator
      • UV Exposure Systems

      Detection and Timing Electronics

      • TCSPC and Time tagging electronics
      • Single Photon Avalance Diodes
      • Hybrid Photomultiplier Detector Assembly
      • Analysis Software
      • Single Photon Counting Modules
      • Avalanche Photodiodes
      • IR Detectors

      Educational Laser kits

      • Fourier Transform Spectroscopy
      • Holography
      • Nd-Yag Laser
      • He-Ne Laser
      • Diode Laser

      High Resolution 3D Printer

      Ion Implanters

      • Medium Current R&D Implanter
      • Medium Current Production Implanter
      • Pulsion

      Mask Aligner and Mask-less Laser Lithography

      Epitaxial Wafers and HEMTs

      • GaN , SiC Based
      • GaAs & InP Based

      Metrology Systems for Semiconductors

      • Spectroscopic Ellipsometer
      • Laser Ellipsometer
      • Deep Level Defect Inspection (DLTS)
      • Scanning Probe Microscopy + Atomic Force Microscope

      Piezo Motion and Vibration Control

      • Piezo Actuators and stages
      • Positioning tools
      • Fiber Switches
      • Amplifiers

      Microscopy

      • Single Photon Counting Microscopy
      • Single Molecule Senstivity Confocal Microscopy
      • Upright Time Resolved Microscopy
      • Fluorescence Lifetime Imaging Software
      • Light Source for Microscopy

      MOCVD Reactors

      • Closed Couple Showerhead (CCS)
      • Planetary Reactor

      Molecular-Beam Epitaxy

      Low Temperature STM/AFM

      Photoresist & Developer for micro-structuring

      QCW diode bars & stacks

      • Conduction-cooled QCW stacked array
      • Dual QCW Linear stacked arrays
      • High Temperature/Multi-color QCW stack arrays
      • QCW linear bar arrays
      • QCW mini-stacked arrays
      • QCW stacked array (FAC)

      Reference tools for measurment

      • Scientific Instruments
      • Vacuum Instruments
      • Time & Frequency
      • Analytical Instruments
      • Test & Measurment Instruments

      Plasma Enhance Chemical Vapor Deposition

      Reactive Ion Etching

      Semi Conductor Crystals

      Spectroscopy

      • Lifetime and Steady Steate Spectrometer
      • Modular Life Time spectrometer
      • Data Analysis Software

      Spin Coaters

      Surface Treatment Systems

      • UV Ozone Cleaning
      • Basic Plasma Cleaners
      • Expanded Plasma Cleaners
      • High Power Expanded Plasma Cleaners
      • Rapid Temperature Annealing Systems

      TeraHertz Systems

      • Frequency Domain Setup
      • Time Domain Setup
      • THz power and Energy Detectors
      • TeraSpike Microprobe Series

      UV Exposure Systems

      Wafer Handling Tools

      Interferometer

      • Broadband Spectroscopy
      • 2D Electronic Spectroscopy

      Hyperspectral Camera

      • NIR 400-1000 nm
      • SWIR 900-1700 nm
      • Extended SWIR 900-2300 nm
  • Applications
      • LED Chip Manufacturing
      • Life Sciences
      • Lithography
      • Material Science
      • MEMS Technology
      • Metrology
      • Microfluidics
      • Nanotechnology
      • Photonics
      • PV Solar Energy
      • Quantum Technology
      • Scientific Educational Kits
      • Spectroscopy
      • Terahertz Sensing
      • Thin Film
      • UV Exposure
  • Learning Center
  • Partners
  • Events
    • Upcoming
    • Past Events
  • Career
  • Company
  • Contact Us
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Coincidence Correlation
Atom Laser Cooling and Trapping
Ion Laser Cooling and Trapping
Optical Pumping and EIT
Degenerate Quantum Gases
Rydberg Excitation
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Direct Frequency Comb Spectroscopy

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      © 2023 Simco Global. All Rights Reserved.

      • Home
      • Products
        • Metrology Systems for PV Research and Industries

          • Thin Film Thickness Measurement (SE2000)
          • Ion Implant Monitoring (RT-1000)
          • Lifetime Measurement System WT-2000PVN
          • Lifetime Measurement System WT-1200A
          • Four Point Probe (FPP)
          • Emmitter Sheet Resistance (CMS)
          • Thickness Measurement (WTT)
          • Non Contact Resistivity Profiling
          • Contactless Resistivity Mapper
          • Non Contact CV Profiling
          • Minority Carrier Diffusion Length Measurement
          • Nanoindentation
          • Fourier Transformed Infrared Spectroscopy (FTIR)
          • Non Contact Mobility by Microwave Reflectance
          • Low Angle Light Scattering Tomography
          • Non-Contact Mobility and Sheet Resistance Metrology System
          • Mercury CV Profiling
          • Infrared Block Imaging
          • Photoluminescence Imaging
          • Ion Imlpant Dose Monitoring
          • P/N Type Determination
          • Geometry Inspection for Wafers
          • Saw Mark Inspection for Wafers
          • Sample Transfer Shuttle
          • Color Measurement for Cells

          Lasers

          • CW Fiber Lasers & Amplifiers
          • ps/fs fiber lasers
          • Single Mode Diode Lasers
          • Single Frequency Lasers
          • Tunable Diode Lasers
          • Multi Laser Engines
          • Picosecond Pulsed Lasers
          • High Power and UV Lasers
          • Nitrogen Lasers
          • Frequency Comb
          • Laser Rack Systems
          • Pulsed Laser Diodes
          • CW Laser Diodes
          • HeNe Lasers

          Mask Aligner and Solar Simulator

          • Mask Aligner
          • Solar Simulator
          • UV Exposure Systems

          Detection and Timing Electronics

          • TCSPC and Time tagging electronics
          • Single Photon Avalance Diodes
          • Hybrid Photomultiplier Detector Assembly
          • Analysis Software
          • Single Photon Counting Modules
          • Avalanche Photodiodes
          • IR Detectors

          Educational Laser kits

          • Fourier Transform Spectroscopy
          • Holography
          • Nd-Yag Laser
          • He-Ne Laser
          • Diode Laser

          High Resolution 3D Printer

          Ion Implanters

          • Medium Current R&D Implanter
          • Medium Current Production Implanter
          • Pulsion

          Mask Aligner and Mask-less Laser Lithography

          Epitaxial Wafers and HEMTs

          • GaN , SiC Based
          • GaAs & InP Based

          Metrology Systems for Semiconductors

          • Spectroscopic Ellipsometer
          • Laser Ellipsometer
          • Deep Level Defect Inspection (DLTS)
          • Scanning Probe Microscopy + Atomic Force Microscope

          Piezo Motion and Vibration Control

          • Piezo Actuators and stages
          • Positioning tools
          • Fiber Switches
          • Amplifiers

          Microscopy

          • Single Photon Counting Microscopy
          • Single Molecule Senstivity Confocal Microscopy
          • Upright Time Resolved Microscopy
          • Fluorescence Lifetime Imaging Software
          • Light Source for Microscopy

          MOCVD Reactors

          • Closed Couple Showerhead (CCS)
          • Planetary Reactor

          Molecular-Beam Epitaxy

          Low Temperature STM/AFM

          Photoresist & Developer for micro-structuring

          QCW diode bars & stacks

          • Conduction-cooled QCW stacked array
          • Dual QCW Linear stacked arrays
          • High Temperature/Multi-color QCW stack arrays
          • QCW linear bar arrays
          • QCW mini-stacked arrays
          • QCW stacked array (FAC)

          Reference tools for measurment

          • Scientific Instruments
          • Vacuum Instruments
          • Time & Frequency
          • Analytical Instruments
          • Test & Measurment Instruments

          Plasma Enhance Chemical Vapor Deposition

          Reactive Ion Etching

          Semi Conductor Crystals

          Spectroscopy

          • Lifetime and Steady Steate Spectrometer
          • Modular Life Time spectrometer
          • Data Analysis Software

          Spin Coaters

          Surface Treatment Systems

          • UV Ozone Cleaning
          • Basic Plasma Cleaners
          • Expanded Plasma Cleaners
          • High Power Expanded Plasma Cleaners
          • Rapid Temperature Annealing Systems

          TeraHertz Systems

          • Frequency Domain Setup
          • Time Domain Setup
          • THz power and Energy Detectors
          • TeraSpike Microprobe Series

          UV Exposure Systems

          Wafer Handling Tools

          Interferometer

          • Broadband Spectroscopy
          • 2D Electronic Spectroscopy

          Hyperspectral Camera

          • NIR 400-1000 nm
          • SWIR 900-1700 nm
          • Extended SWIR 900-2300 nm
      • Applications
          • LED Chip Manufacturing
          • Life Sciences
          • Lithography
          • Material Science
          • MEMS Technology
          • Metrology
          • Microfluidics
          • Nanotechnology
          • Photonics
          • PV Solar Energy
          • Quantum Technology
          • Scientific Educational Kits
          • Spectroscopy
          • Terahertz Sensing
          • Thin Film
          • UV Exposure
      • Learning Center
      • Partners
      • Events
        • Upcoming
        • Past Events
      • Career
      • Company
      • Contact Us
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      © 2023 Simco Global. All Rights Reserved.