Metrology
Overview
Metrological Tools are very important in order to characterize your materials and devices. SIMCO offers the following instruments and equipment,
- Solar PV wafers metrology,
- Carrier Lifetime, micro-PCD, Sheet Resistance
- LBIC Measurement
- IQE and EQE Measurement
- Resistivity & Thickness Measurement
- Laser & Spectroscopic Ellipsometer in UV-VIS-IR range
- Nano-Hardness tester
- Thin Film thickness measurement using reflectometry
- Lock-in Amplifiers and Boxcar averager, RGA, Vacuum gauge
- X-ray Photoelectron Spectroscopy for ESCA, XPS, ARPES, SEM
- Solar Simulators for Solar PV
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