October 16, 2021
Complex Dismissal for a Small Company
Beguiled and demoralized charms of pleasure of the moment so blinded.
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Metrology Systems for PV Research and Industries
- Thin Film Thickness Measurement (SE2000)
- Ion Implant Monitoring (RT-1000)
- Lifetime Measurement System WT-2000PVN
- Lifetime Measurement System WT-1200A
- Four Point Probe (FPP)
- Emmitter Sheet Resistance (CMS)
- Thickness Measurement (WTT)
- Non Contact Resistivity Profiling
- Contactless Resistivity Mapper
- Non Contact CV Profiling
- Minority Carrier Diffusion Length Measurement
- Nanoindentation
- Fourier Transformed Infrared Spectroscopy (FTIR)
- Non Contact Mobility by Microwave Reflectance
- Low Angle Light Scattering Tomography
- Non-Contact Mobility and Sheet Resistance Metrology System
- Mercury CV Profiling
- Infrared Block Imaging
- Photoluminescence Imaging
- Ion Imlpant Dose Monitoring
- P/N Type Determination
- Geometry Inspection for Wafers
- Saw Mark Inspection for Wafers
- Sample Transfer Shuttle
- Color Measurement for Cells
Lasers
Mask Aligner and Solar Simulator
Detection and Timing Electronics
Educational Laser kits
Ion Implanters
Epitaxial Wafers and HEMTs
Metrology Systems for Semiconductors
Piezo Motion and Vibration Control
Microscopy
MOCVD Reactors
QCW diode bars & stacks
Reference tools for measurment
Spectroscopy
Surface Treatment Systems
TeraHertz Systems
Interferometer
Hyperspectral Camera
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- Applications
- Learning Center
- Events
- Partners
- About Us
- Home
- Products
-
Metrology Systems for PV Research and Industries
- Thin Film Thickness Measurement (SE2000)
- Ion Implant Monitoring (RT-1000)
- Lifetime Measurement System WT-2000PVN
- Lifetime Measurement System WT-1200A
- Four Point Probe (FPP)
- Emmitter Sheet Resistance (CMS)
- Thickness Measurement (WTT)
- Non Contact Resistivity Profiling
- Contactless Resistivity Mapper
- Non Contact CV Profiling
- Minority Carrier Diffusion Length Measurement
- Nanoindentation
- Fourier Transformed Infrared Spectroscopy (FTIR)
- Non Contact Mobility by Microwave Reflectance
- Low Angle Light Scattering Tomography
- Non-Contact Mobility and Sheet Resistance Metrology System
- Mercury CV Profiling
- Infrared Block Imaging
- Photoluminescence Imaging
- Ion Imlpant Dose Monitoring
- P/N Type Determination
- Geometry Inspection for Wafers
- Saw Mark Inspection for Wafers
- Sample Transfer Shuttle
- Color Measurement for Cells
Lasers
Mask Aligner and Solar Simulator
Detection and Timing Electronics
Educational Laser kits
Ion Implanters
Epitaxial Wafers and HEMTs
Metrology Systems for Semiconductors
Piezo Motion and Vibration Control
Microscopy
MOCVD Reactors
QCW diode bars & stacks
Reference tools for measurment
Spectroscopy
Surface Treatment Systems
TeraHertz Systems
Interferometer
Hyperspectral Camera
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- Applications
- Learning Center
- Events
- Partners
- About Us
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© 2023 Simco Global. All Rights Reserved.